0000007336 00000 n 0000031783 00000 n 0000061569 00000 n TSE: 6857. TSE: 6857. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. This class introduces the V93000 SOC Series (using Smart Scale cards). HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. 0000079792 00000 n Now, multiple RF communication standards are integrated into one RF circuit. Key concepts and components of the V93000. This paragraph applies only to the extent permitted by applicable law. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. 0000080030 00000 n Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. Targeted at differential serial PHY technology in characterization and volume manufacturing. The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. 0000160939 00000 n is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. Superior x/y repeatability after cleaning step. 0000012694 00000 n Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. ATE to ATE Conversion. Auto Loading / Unloading Feature for Manual Equipment . The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. 0000014977 00000 n It improves throughput while maintaining compatibility with the established MBAV8 instrument. 0000031694 00000 n 0000006289 00000 n TSE: 6857. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. Click on more information for further details. Verigy V93000 Pin Scale 1600 VelocityCAE. Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. 0000012183 00000 n All Rights Reserved. By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. TEAM A.T.E. ProgramGenerator. 0000016567 00000 n ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. 0000079718 00000 n Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. 0000059009 00000 n After completion the student will be familiar with the following: Advantest Corporation 0000332614 00000 n By clicking any link on this page you are giving consent for us to set cookies. V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. TSE: 6857. Click on more information for further details. The more that could be run in parallel, the greater the test time savings. TSE: 6857. V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. Pin configuration setup of levels, timing, and vectors. 0000013109 00000 n Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. 11 0 obj <> endobj xref 11 73 0000000016 00000 n Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. Click on more information for further details. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. 0000006781 00000 n V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. Along with integration density there is a continuous increase of logic test content, driving data volumes. The user benefits are reduced test time, best repeatability and simplified program creation. 0000010927 00000 n Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. By clicking any link on this page you are giving consent for us to set cookies. Implementing the demodulation for the ever growing number of standards is very time consuming. All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. The platform has become the all purpose reference platform. A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. Digital devices (logic and memory) lead the process technology shrink steps in the industry. 0000061958 00000 n V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. 0000005901 00000 n The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. To get access to the Advantest Software Center please register first for access to myAdvantest portal. 0000349795 00000 n '.l!oUsV_Si/[I. Model: T2000: Class: SOC ATE / Mixed Signal: S-GL-012. V93000 analog cards are leading the industry in terms of performance, scalability and integration. The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. All features and performance points are available in all classes. Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. 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